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Bismuth nanolines on Si(001) and their influence on mesoscopic surfacestructure
J M MacLeod, C P Lima, R H Miwa, G P Srivastava, and A B McLean
Materials Science and Technology 20 (2004) 951-54
The electronic origin of contrast reversal in bias-dependent STM images of nanolines
J M MacLeod, R H Miwa, G P Srivastava and A B McLean
Surf. Sci. 576 (2005) 116-122.
Forward to Professor G. P. Srivastava publications by first author Mark, AG (1 publication).